Ultrasonic Flaw Detector Double Crystal Soft Film Straight Probe Soft Film Probe Rough Surface Nondestructive Testing UT Longitudinal Wave
Ultrasonic Flaw Detector Double Crystal Soft Film Straight Probe Soft Film Probe Rough Surface Nondestructive Testing UT Longitudinal Wave
Ultrasonic Flaw Detector Double Crystal Soft Film Straight Probe Soft Film Probe Rough Surface Nondestructive Testing UT Longitudinal Wave

Ultrasonic Flaw Detector Double Crystal Soft Film Straight Probe Soft Film Probe Rough Surface Nondestructive Testing UT Longitudinal Wave

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Ultrasonic Flaw Detector Double Crystal Soft Film Straight Probe Soft Film Probe Rough Surface Nondestructive Testing UT Longitudinal Wave

About the product

Characteristic

Origin

Mainland china

Size

Other

Resolution

Other

Item number

HYeswuxtlrtuw

Type

Ultrasonic flaw detector

Brand

Other

Model

2.5P20F10

Weight

Other

Whether to import

No

Measuring range

Other

Processing and customization

No

Order number

Other

There are licensable private brands

No

Description

下单前请确认好探头的规格参数,频率,晶片直径,焦距 ,探头接口型号C5。需要定做,请务必确认好。

超声波探头主要分为:直探头,斜探头,带曲率探头,聚焦探头,表面波探头,水浸探头,双晶探头,测厚探头,高温探头等。进行垂直探伤用的单晶片探头,直探头产生的超声波为垂直于探头表面的纵波声束。

超声波直探头在光滑表面上具有很高增益和非常好的分辨率,用于有保护膜的探头不适合于有锋利边缘的物体检测。带可更换保护膜的直探头,即使是在粗糙或轻微弯曲的表面上,由于柔性的抗磨损保护膜而具有稳定的耦合特性,如果及时的更换保护膜,则探头的磨损可以达到。超声波直探头保护膜分硬膜和软膜。

低频软膜探头:

用于探测较粗糙的被测物体(如钢板)。探头接触被测物体表面时不受压力的影响,其阻抗、静态电容等参数不受影响。

Characters

Properties

Origin

Mainland china

Size

Other

Resolution

Other

Item number

HYeswuxtlrtuw

Description

下单前请确认好探头的规格参数,频率,晶片直径,焦距 ,探头接口型号C5。需要定做,请务必确认好。

超声波探头主要分为:直探头,斜探头,带曲率探头,聚焦探头,表面波探头,水浸探头,双晶探头,测厚探头,高温探头等。进行垂直探伤用的单晶片探头,直探头产生的超声波为垂直于探头表面的纵波声束。

超声波直探头在光滑表面上具有很高增益和非常好的分辨率,用于有保护膜的探头不适合于有锋利边缘的物体检测。带可更换保护膜的直探头,即使是在粗糙或轻微弯曲的表面上,由于柔性的抗磨损保护膜而具有稳定的耦合特性,如果及时的更换保护膜,则探头的磨损可以达到。超声波直探头保护膜分硬膜和软膜。

低频软膜探头:

用于探测较粗糙的被测物体(如钢板)。探头接触被测物体表面时不受压力的影响,其阻抗、静态电容等参数不受影响。

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